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Cameca:

From its inception in 1929, CAMECA has been renowned for its precision mechanics, optics and electronics. The company started in France as a manufacturer of movie theater projectors, and soon the CAMECA products evolved into scientific instrumentation. Since pioneering Electron Probe MicroAnalysis (EPMA) in the 1950's and Secondary Ion Mass Spectrometry (SIMS) in the 1960's, CAMECA has remained the undisputed world leader in these techniques while achieving numerous breakthrough innovations in complementary techniques such as Low energy Electron induced X-ray Emission Spectrometry (LEXES), and 3D Atom Probe. CAMECA has evolved from a manufacturer of scientific instrumentation for the international research community to a provider of in-fab and near-fab metrology solutions for the semiconductor manufacturing industry. Today, CAMECA employs over 300 employees around the world, with locations in the USA, Germany, Japan, Korea, China, and Taiwan, and a wide network of agents, ensuring the best level of support to all users. Our mission is to focus on instrumental development to offer our customers the highest analytical performance in their specialized characterization fields. CAMECA is headquartered in Gennevilliers near Paris, France. Our plant is a state-of-the-art facility with clean room environment, electron and ion optics simulation, advanced CAD, UHV cleaning... Operating under ISO 9001 certification, CAMECA controls not only the technology, but all aspects in the designing, manufacturing, installing and servicing of its products. In 2007, CAMECA joined AMETEK, Inc., a leading global provider of electronic instruments and electromechanical devices, as part of the AMETEK Materials Analysis Division.

 

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SXFive

Electron Probe Micro Analyzer for Materials & Geosciences Combining advance...
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SXFiveFE

Field Emission Electron Probe Micro Analyzer for Quantitative Analysis and X-Ray...
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LEAP 4000X HR

High Performance 3D Atom Probe for Advanced Materials and Metals Applications T...
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EX-300

CAMECA's new generation Shallow Probe: the metrology solution for advanced integ...
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Electron Microprobes

Electron Microprobes
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IMS 1280-HR

Ultra High Sensitivity Magnetic Sector SIMS for Geosciences The CAMECA IMS 1280...
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IMS 7f-GEO

High Performance Compact SIMS for Geoscience Laboratories CAMECA’s IMS 7f...
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NanoSIMS 50L

SIMS Microprobe for Isotopic and Trace Element Analysis at High Spatial Resoluti...
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IMS 7-Auto

IMS 7-Auto CAMECA’s universal SIMS: reference detection sensitivity with ...
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SC Ultra

High Performance Magnetic Sector SIMS for Advanced Semiconductors The CAMECA SC...
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SIMS 4550

Quadrupole SIMS Microprobe for dopant depth profiling and thin layer analysis in...