Lab Micro-spot Stress Analyser – AutoMATE II
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
https://www.rigaku.com/products/xrd/automate
Enquiry Email: info@wirsam.info
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X-ray diffraction (XRD) for stress analysis of large/heavy samples
In the past, if you wanted to make highly accurate residual stress measurements, you had to use an R&D diffractometer because of the accuracy of the goniometer. However, this restricts the weight and size of the samples you can measure. On the other hand, dedicated laboratory and factory-floor residual stress analyzers suffer from reduced accuracy due to the nature of their mechanical designs, while, in their favor, they have the flexibility of measuring large and heavy parts.
World's most advanced residual stress measurement system
Large and heavy samples are measured by AutoMATE II with high accuracy by utilizing a 2-axis goniometer with a stationary sample stage. The working volume for a sample is 720 mm (W) × 560 mm (D) × 540 mm (H) and the maximum sample weight is 30 kg. An optional sample stage can hold 20 kg and is equipped with an automatic XYZ stage with X, Y translations of -50 ≤ X, Y ≤ 50 mm and a Z translation of -5 ≤ Z ≤ 35 mm. The working volume for a sample with the automated XYZ stage is 720 mm (W) × 560 mm (D) × 335 mm (H). Some testing devices, including a 4-point bending device, can be attached to the sample stage. The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and perform scans with minimum steps of 0.1 microns when using the automated XYZ stage.
http://www.rigaku.com/en/products/xrd/automate
Enquiry Email: info@wirsam.info
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