FIB SEMS – Amber / Solaris
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- UHR imaging of beam-sensitive samples at low-kV
- Routine investigation of heavy-metal stained resin-embedded samples with excellent contrast using the In-beam BSE detector at low-kV
- Best resolution Ga FIB column with optimized ion optics for excellent performance and reproducibility
- Site-specific TEM lamella preparation and in-situ visualization with an easy-to-use STEM detector that offers cost-effective imaging results comparable to TEM
- 3D nanovisualization and volume reconstruction of resin-embedded cellular structures
- Cryo UHR SEM imaging and cryo-FIB-SEM applications
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