FIB SEMS – Amber / Solaris

Tescan has a range of FIB (Focussed Ion Beam) SEM’s built around the Amber and Solaris platform. For more information on available models and other options please visit:

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  • UHR imaging of beam-sensitive samples at low-kV
  • Routine investigation of heavy-metal stained resin-embedded samples with excellent contrast using the In-beam BSE detector at low-kV
  • Best resolution Ga FIB column with optimized ion optics for excellent performance and reproducibility
  • Site-specific TEM lamella preparation and in-situ visualization with an easy-to-use STEM detector that offers cost-effective imaging results comparable to TEM
  • 3D nanovisualization and volume reconstruction of resin-embedded cellular structures
  • Cryo UHR SEM imaging and cryo-FIB-SEM applications

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TESCAN is one of the global suppliers of scientific instruments. The company is building its reputation and brand name in the field of designing and manufacturing scanning electron microscopes and system solutions for different applications. The company is focused on research, development, and manufacturing of scientific instruments and laboratory equipment such as: Research & Development TESCAN strives to keep improving continuously their products, which creates a competitive advantage for its customers. The TESCAN brand is becoming established thanks to the company's participation in top research projects and cooperation with the leading companies in the field of electron microscopy and microanalysis. As a result, TESCAN's instrumentation and innovative solutions have won a leading position in the world of nano- and microtechnology. Manufacturing philosophy We recognize that the highest quality and reliability of our products is the foundation of our business. The advanced information system for resources and company processes optimization, the top level of our technology equipment and quality management system constitute the real preconditions for meeting customer expectations about quality, price, and delivery.


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