AFM
Nanosurf Atomic Force Microscopes
- Compact, user-friendly atomic force microscope
- Nanoscale surface imaging and force measurement
- Contact, tapping and force spectroscopy modes
- Automated laser alignment and probe approach
- Suitable for teaching, QC and research
Product Overview
Nanosurf atomic force microscopes provide nanometre-resolution surface topography, mechanical properties and electrical characterisation. Contact, non-contact and tapping modes for materials science, nanotechnology, biology and semiconductor research applications.
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Technical Specifications
| Type | Atomic Force Microscope (AFM) |
| Modes | Contact, tapping, force spectroscopy, lateral force |
| Scan Range | Up to 110 × 110 µm (XY), 22 µm (Z) |
| Resolution | Sub-nanometre (Z) |
| Sample Size | Model dependent |
| Laser Alignment | Automated |
| Probe Approach | Automated |
| Software | Nanosurf C3000 / Mobile S |
| Manufacturer | Nanosurf |
| Power | 100–240 V / 50–60 Hz |
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