AMBER 2
Ga+ FIB-SEM
- Gallium FIB for precision nanofabrication and TEM lamella preparation
- High-resolution SEM imaging with Schottky FE source
- Site-specific cross-sectioning and 3D serial sectioning
- STEM detector for direct TEM-quality imaging in the FIB-SEM
- Automated workflows for correlative microscopy and tomography
Product Overview
The TESCAN AMBER 2 is a gallium focused ion beam scanning electron microscope (Ga-FIB-SEM) designed for precision nanofabrication, site-specific TEM sample preparation and high-resolution 3D characterisation. It combines a high-brightness Schottky field emission SEM column with a precise gallium liquid metal ion source FIB column for simultaneous imaging and milling at the nanoscale.
The AMBER 2 is widely used in semiconductor failure analysis, materials science, geology and life science for cross-section preparation, 3D volume reconstruction, circuit editing and correlative microscopy workflows. Its automated slice-and-view capability enables large-volume 3D data acquisition with minimal user intervention.
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Technical Specifications
| Technique | Ga+ FIB-SEM |
| SEM Source | Schottky field emission |
| FIB Source | Gallium liquid metal ion source |
| SEM Resolution | <1 nm at 30 kV |
| FIB Resolution | <2.5 nm at 30 kV |
| FIB Voltage | 500 V – 30 kV |
| GIS | Multi-nozzle gas injection system |
| Manufacturer | TESCAN |
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