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TESCAN

CLARA

TESCAN CLARA

High Resolution FE-SEM — TESCAN
  • Cold field emission gun (CFEG) for maximum brightness
  • Sub-nanometre resolution at low accelerating voltages
  • Advanced analytical detector suite
  • In-situ experiment compatibility
  • Ideal for beam-sensitive and low-contrast samples

Product Overview

The TESCAN CLARA is a high-resolution analytical scanning electron microscope featuring a cold field emission gun for the highest brightness and coherence. Designed for advanced nanoscale characterisation, the CLARA delivers exceptional resolution and analytical performance for semiconductor and advanced materials research.

Manufacturer

TESCAN

All TESCAN products on Wirsam →

Category

Microscopy

TESCAN — Field Emission SEM (FE-SEM)

Supplier Page

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Technical Specifications

Manufacturer TESCAN
Category Microscopy — Scanning Electron Microscopy (SEM)

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