EIKOS
Atom Probe System
- Affordable atom probe tomography for broader lab access
- 3D atomic-scale materials characterisation
- Simplified operation and maintenance
- Laser pulsing for diverse material types
- Compatible with standard FIB-prepared specimens
Product Overview
The CAMECA EIKOS is an affordable atom probe tomography (APT) system designed to bring atomic-scale 3D materials characterisation to a wider range of laboratories and applications. The EIKOS delivers the core capabilities of atom probe tomography — atomic-level compositional mapping in three dimensions — in a more compact and accessible package than the flagship LEAP system.
The EIKOS is particularly well suited for university research groups, industrial R&D laboratories and materials science departments seeking to add atom probe capability without the infrastructure requirements of larger systems. Applications include metallurgy, advanced alloy development, semiconductor characterisation and nanomaterials research where understanding atomic-scale composition and distribution is critical.
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Technical Specifications
| Technique | Atom Probe Tomography (APT) |
| Spatial Resolution | Sub-nanometre |
| Pulsing | Laser pulsing |
| Detector | Position-sensitive time-of-flight |
| Specimen Temperature | Cryogenic |
| Specimen Preparation | Standard FIB lift-out |
| Analysis Volume | Millions of atoms |
| Software | CAMECA data analysis suite |
| Applications | Metals, semiconductors, ceramics |
| Power | Single-phase 230 V / 50–60 Hz |
Downloads & Resources
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