LEAP 6000
3D Atom Probe
- 3D atomic-scale characterisation with single-atom sensitivity
- Detection efficiency exceeding 80%
- Laser and voltage pulsing modes
- Wide field of view for large-area analysis
- Advanced reconstruction software with integrated data analytics
Product Overview
The CAMECA LEAP 6000 is the latest generation local electrode atom probe (APT) system, providing three-dimensional atomic-scale characterisation of materials with single-atom sensitivity. The LEAP 6000 reconstructs the position and identity of individual atoms within a needle-shaped specimen, producing 3D atom maps with sub-nanometre spatial resolution and parts-per-million analytical sensitivity.
Atom probe tomography with the LEAP 6000 is used in metallurgy, semiconductor development, geology, battery research and advanced materials science for studying grain boundaries, precipitates, thin films, dopant distributions and nanoscale compositional variations that cannot be resolved by any other analytical technique. The LEAP 6000 offers improved data collection rates, enhanced mass resolving power and expanded field of view compared to previous generations.
Supplier Page
Technical Specifications
| Technique | Atom Probe Tomography (APT) |
| Spatial Resolution | <0.3 nm (depth), ~0.3 nm (lateral) |
| Detection Efficiency | >80% |
| Field of View | Up to 200 nm × 200 nm |
| Pulsing Modes | Laser and voltage |
| Mass Resolution | M/ΔM > 1000 (FWHM) |
| Specimen | Needle-shaped (<100 nm tip radius) |
| Detector | Position-sensitive, time-of-flight |
| Cryogenics | 20–80 K specimen temperature |
| Software | IVAS / AP Suite |
Downloads & Resources
Contact us to request brochures, application notes or technical data sheets for this product.
Industries & Applications
Commonly used in the following sectors
Interested in the LEAP 6000?
Our specialists will help you find the right solution for your application and budget.