Product Overview

Rigaku total reflection X-ray fluorescence (TXRF) spectrometers provide ultra-trace elemental analysis with detection limits in the parts-per-billion (ppb) range. TXRF uses a grazing-incidence geometry to dramatically reduce background signals, enabling the detection of trace and ultra-trace elements in microlitre sample volumes deposited on a polished carrier.

TXRF spectrometers are used in semiconductor contamination monitoring, pharmaceutical quality control, environmental water analysis, forensics and materials research where extremely low detection limits are required from very small sample quantities. The technique requires minimal sample preparation, consumes negligible amounts of material and is inherently non-destructive to the carrier surface.