NEX CG II
Cartesian Geometry EDXRF
- Cartesian geometry EDXRF for enhanced sensitivity
- Secondary and polarisation targets reduce background
- Silicon drift detector (SDD) with excellent energy resolution
- Trace-level detection for regulatory compliance
- Suitable for environmental, mining and petrochemical analysis
Product Overview
The Rigaku NEX CG II is a cartesian-geometry energy dispersive X-ray fluorescence (EDXRF) spectrometer designed by Applied Rigaku Technologies for high-sensitivity elemental analysis. The NEX CG II features close-coupled cartesian geometry with secondary and polarisation targets, providing significantly improved detection limits and reduced spectral background compared to conventional EDXRF systems.
This instrument bridges the performance gap between standard EDXRF and WDXRF systems, making it ideal for applications requiring low detection limits in a compact, benchtop format. The NEX CG II is used in environmental compliance testing, petroleum product analysis, mining exploration, metals quality control and industrial process monitoring where accuracy at trace levels is critical.
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Technical Specifications
| Technique | Cartesian Geometry EDXRF |
| Detector | Silicon Drift Detector (SDD) |
| Excitation | Secondary and polarisation targets |
| Element Range | Na – U |
| Energy Resolution | <135 eV (Mn Kα) |
| Sample Chamber | 12-position autosampler |
| Atmosphere | Vacuum, helium or air |
| Software | Rigaku SPECTRAPLUS |
| Compliance | EPA, ISO, ASTM methods |
| Power | Single-phase 100–240 V / 50–60 Hz |
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