Simultix 15
High-Throughput Simultaneous WDXRF Spectrometer
- Simultaneous multi-channel WDXRF — all elements measured at once, no moving parts
- Up to 30 fixed channels standard, optionally expandable to 40
- 4 kW X-ray tube (3 kW optional) for maximum sensitivity
- Tube-above optical configuration — protects optics from contamination
- 48-position automatic sample changer; optional belt-in feed for full automation
- New RX85 synthetic multilayer crystals — 30% greater intensity for Be-Kα and B-Kα
- Optional scanning goniometer for additional elemental flexibility
- Optional XRD channel for simultaneous phase analysis
- Industry-proven platform with nearly 1,000 installations worldwide
Product Overview
The Rigaku Simultix 15 is a simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer designed for the highest-throughput elemental analysis in demanding industrial process control environments. Each Simultix 15 is customised with a specific set of discrete fixed channels measuring all elements simultaneously — without moving parts, without time delay and without compromise — making it the optimal solution for time-to-result, precision, low cost-per-analysis and long instrument longevity.
The Simultix 15 combines the spectral resolution and sensitivity of WDXRF technology with the analytical speed of EDXRF, ideal for operations processing large numbers of solid, powder or liquid samples in continuous process control. The tube-above optical configuration protects sensitive components from contamination, and new RX85 synthetic multilayer crystals deliver ~30% greater intensity for Be-Kα and B-Kα. Optional scanning goniometer and XRD channel provide additional analytical flexibility for non-routine elements and phase analysis.
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Technical Specifications
| Technique | Simultaneous Wavelength Dispersive XRF (WDXRF) |
| Configuration | Tube-above simultaneous multi-channel spectrometer |
| Element Range | Be to U (beryllium to uranium) in almost any sample matrix |
| Fixed Channels | Up to 30 standard; optionally expandable to 40 |
| X-ray Tube | 4 kW (standard); 3 kW optional |
| Crystals | Fixed optimised per channel; RX85 synthetic multilayers for light elements |
| Optional Goniometer | Scanning goniometer for heavy elements (Ti–U) or heavy and light elements |
| Optional XRD Channel | Simultaneous XRF and XRD analysis available |
| Autosampler | 48-position automatic sample changer |
| Automation | Optional Sample Loading Unit with belt-in feed (left or right side) |
| Optional BG Measurement | Background measurement for fixed channels |
| Optional APC System | Automatic pressure control for light element precision |
| Doubly Curved Crystal | Optional — increases intensity vs single curved crystal |
| Software | Simultix 15 Windows-based with ZSX-style quantitative analysis flow bar |
| Power | Three-phase (site-dependent) |
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