
NANOS
Semplor NANOS — Compact Desktop SEM with Optional Integrated EDS

- High-performance SE and 4-quadrant BSD detectors with mixed-mode imaging
- Optional integrated 30 mm² SDD for EDS point analysis, line scans and element mapping
- Low-vacuum mode (40 Pa) for non-conductive samples without sputter coating
- Eucentric tilt stage with motorised XY (25 × 25 mm) and manual tilt to 55°
- User-replaceable tungsten filament — 1,000+ hours in ECO mode, no service visit
Product Overview
The Semplor NANOS is a compact tabletop scanning electron microscope delivering sub-8 nm resolution with high-performance SE and BSD detectors as standard, and optional integrated EDS for elemental analysis. The base configuration includes a secondary electron detector (SED) and a four-quadrant backscattered electron detector (BSD). An embedded silicon drift detector (SDD) for energy-dispersive X-ray spectroscopy (EDS) can be added for point analysis, line scans and full element mapping.
The NANOS provides immediate access to SEM capabilities — making it well-suited for labs looking to reduce reliance on external SEM services or to offload routine work from larger floor-model instruments. With a small footprint, excellent system stability, and no need for dedicated infrastructure, the NANOS fits seamlessly into any lab environment.
A unique design feature is the clean vacuum chamber with no moving mechanical parts inside, eliminating contamination risk and reducing maintenance. The user-replaceable tungsten filament delivers over 1,000 hours of operation in ECO mode and can be swapped with a simple alignment tool — no service visit required.
The Discover Platform provides an intuitive single-screen interface for SEM imaging and EDS analysis, with both Basic and Advanced modes. An optical navigation camera displays a full-field colour image of the sample surface upon insertion, enabling rapid identification of areas of interest before switching to electron imaging.
Applications include materials science, geology, mining, battery research, construction materials, textiles, forensics, quality control and education. NANOS systems are installed in research institutions, industrial laboratories and defence and aerospace facilities across more than 30 countries.
Key Highlights
- Sub-8 nm resolution
- SED + BSD standard, optional integrated EDS
- 280 × 470 × 550 mm, 62 kg
- No dedicated infrastructure required
- Over 200 years combined EM experience
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Our microscopy specialists can help you evaluate the NANOS for your application.
Technical Specifications
| Resolution | <8 nm |
| Magnification | 100–200,000× |
| Acceleration Voltage | 1–20 kV (7 presets) |
| Detectors | SED + 4-quadrant BSD + integrated EDS |
| EDS Detector | 30 mm² SDD, <132 eV at Mn Kα |
| Capture Resolution | Up to 4096 × 4096 (4K) |
| Stage | Eucentric tilt +15° to −40°, motorised XY 25 × 25 mm |
| Max Sample Size | 45 mm dia × 19 mm height (optional 40 mm) |
| Vacuum Modes | High vacuum + low vacuum (40 Pa) |
| Dimensions | 280 × 470 × 550 mm, 62 kg |
Downloads
Product brochures and datasheets will be available here. Contact us for the latest documentation.
Industries & Applications
Need help selecting the right desktop SEM?
Our microscopy specialists can help you evaluate the Semplor NANOS for your application and arrange a demonstration.