For wafer surface contamination, the Rigaku NanoHunter II TXRF provides sub-ppb trace metal detection. For thin film characterisation, the Rigaku SmartLab high-resolution XRD provides epitaxial layer quality, thickness, and composition. For nanoscale surface topography, the Evident LEXT OLS5500 laser confocal microscope provides 10 nm vertical resolution.

We supply TESCAN FIB-SEM systems including the AMBER 2 (gallium FIB-SEM) for precise site-specific sample preparation and TEM lamella preparation. The TESCAN SOLARIS xenon plasma FIB-SEM provides removal rates 50x faster than gallium for large-area milling. Both include integrated EDS and EBSD.

Yes. We supply CAMECA LEAP atom probe tomographs for 3D atomic-scale compositional analysis of semiconductor structures, dopant distributions, and interface chemistry. The LEAP 6000 laser-assisted system is ideal for low-conductivity semiconductor materials.

We provide detailed specifications, pricing, and technical documentation for grant applications. Our team works directly with researchers to ensure instrument specifications meet project requirements and liaises with manufacturers for demonstrations and reference site visits.